Quantitative Analysis Of PGM Using ICP-MS, ICP-AES, AAS, And XRF

Quantitative analysis of Platinum Group Metals from ore samples and industrial materials using Inductively Coupled Plasma-Mass Spectrometer (ICP-MS), Inductively Coupled Plasma-Atomic Emission Spectrometer (ICP-AES), Atomic Absorption Spectrometer(AAS), and X-ray Fluorescence (XRF) techniques was conducted and the performance of various techniques was compared. The effects of different matrices in the sample materials were compared and discussed for each analytical technique. The ICP-AES technique exhibited better accuracy than AAS but showed limitations in its application due to strong spectral interference in the presence of common matrix elements such as iron. The ICP-MS showed the lowest detection limit and less spectral interferences than the previous two techniques. The XRF technique was also applied to examine the total amount of PGM from industrial materials. Results from each analytical method on various sources were presented and discussed.