Application of conducting atomic force microscopy to the study of Ni-YSZ SOFC electrode materials

Commercial SOFC systems will likely utilize hydrocarbons or hydrogen produced from hydrocarbon fuels and therefore will likely be exposed to sulfur impurities. Conducting-Atomic Force Microscopy (C-AFM) is a scanning probe microscopy technique which maps both sample topography and conductivity with tens of nanometers resolution. In Ni-YSZ, C-AFM measures the resistance of the metallic network at scanned locations, with the ability to differentiate between interconnected and isolated metallic particles. We have applied C-AFM to Ni-YSZ SOFC anode materials, with the goal of monitoring changes in the conductivity of the Ni anode network resulting from SOFC degradation processes, such as H2S poisoning.